| Autor: |
Shu-qin Lv, Wen-jia Han, Jian-gang Yu, Hang Zhou, Mi Liu, Chang-an Chen, Kai-gui Zhu |
| Předmět: |
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| Zdroj: |
Chinese Physics Letters; Dec2018, Vol. 35 Issue 12, p1-1, 1p |
| Abstrakt: |
Pure tungsten (W) and chromium doped W (W-5%Cr) are prepared by powder metallurgy. The microstructure, blistering and helium retention are investigated by x-ray diffraction, scanning electron microscopy, transmission electron microscopy and thermal desorption spectroscopy (TDS). These results show that the average size and density of helium blisters on the surface of pure W are much larger than those on the W-5%Cr alloy. Vacancy-impurity pairs can reduce the migration coefficients of vacancy and vacancy-helium complexes, and Cr may play a role of such an impurity. Moreover, the TDS result shows that the highest desorption peak moves to higher temperature, which is attributed to the HemCrkVn complexes in the W-Cr alloy. In addition, the helium retention is found to be higher in W than in W-5%Cr. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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