Inspecting adaptive optics with at-wavelength wavefront metrology.
| Autor: | J., Krempaský, F., Koch, P., Vagovič, L., Mikeš, A., Jaggi, C., Svetina, U., Flechsig, L., Patthey, S., Marathe, D., Batey, S., Cipiccia, C., Rau, F., Seiboth, M., Seaberg, C., David, U. H., Wagner |
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| Zdroj: | Proceedings of SPIE; 7/8/2018, Vol. 10761, p1-8, 8p |
| Databáze: | Complementary Index |
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