Electrical characterization and examination of temperature-induced degradation of metastable Ge0.81Sn0.19 nanowires.
| Autor: | Sistani, M., Seifner, M. S., Bartmann, M. G., Smoliner, J., Lugstein, A., Barth, S. |
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| Zdroj: | Nanoscale; 11/7/2018, Vol. 10 Issue 41, p19443-19449, 7p |
| Databáze: | Complementary Index |
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