Atomic force microscopy combined with optical tweezers (AFM/OT): characterization of micro and nanomaterial interactions.
| Autor: | Zembrzycki, K., Kowalewski, T. A., Pawlowska, S., Chrzanowska-Gizynska, J., Nowak, M., Walczak, M., Pierini, F. |
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| Zdroj: | Proceedings of SPIE; 5/31/2018, Vol. 10723, p1-6, 6p |
| Databáze: | Complementary Index |
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