AC dielectric properties of SiO2 thin layers implanted with In and Sb ions.
Autor: | Czarnacka, Karolina, Koltunowicz, Tomasz N., Fedotov, Aleksander K. |
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Zdroj: | Proceedings of SPIE; 8/24/2018, Vol. 10808, p1-7, 7p |
Databáze: | Complementary Index |
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