Autor: |
Gandhi, Ashish C., Wei-Shan Yeoh, Ming-An Wu, Ching-Hao Liao, Dai-Yao Chiu, Wei-Li Yeh, Yue-Lin Huang |
Předmět: |
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Zdroj: |
Nanomaterials (2079-4991); Aug2018, Vol. 8 Issue 8, p632, 10p |
Abstrakt: |
High-quality crystalline nanostructured ZnO thin films were grown on sapphire substrates by reactive sputtering. As-grown and post-annealed films (in air) with various grain sizes (2 to 29 nm) were investigated by scanning electron microscopy, X-ray diffraction, and Raman scattering. The electron-phonon coupling (EPC) strength, deduced from the ratio of the second- to the first-order Raman scattering intensity, diminished by reducing the ZnO grain size, which mainly relates to the Fröhlich interactions. Our finding suggests that in the spatially quantum-confined system the low polar nature leads to weak EPC. The outcome of this study is important for the development of nanoscale high-performance optoelectronic devices. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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