Post-fabrication metrology and analysis of the LMT segmented secondary reflector.

Autor: Huerta, Andrea León, Smith, David R., Gale, David M., Torres, Carlos Tzile, Rios, Emilio Hernández, Santos, David Castro, Valsecchi, G., Bianucci, G.
Zdroj: Proceedings of SPIE; 5/14/2018, Vol. 10706, p1-13, 13p
Databáze: Complementary Index