Post-fabrication metrology and analysis of the LMT segmented secondary reflector.
Autor: | Huerta, Andrea León, Smith, David R., Gale, David M., Torres, Carlos Tzile, Rios, Emilio Hernández, Santos, David Castro, Valsecchi, G., Bianucci, G. |
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Zdroj: | Proceedings of SPIE; 5/14/2018, Vol. 10706, p1-13, 13p |
Databáze: | Complementary Index |
Externí odkaz: |