| Autor: |
Soloshenko, I. A., Goretsky, V. P., Gorshkov, V. N., Zavalov, A. M. |
| Předmět: |
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| Zdroj: |
Review of Scientific Instruments; May2004, Vol. 75 Issue 5, p1774-1776, 3p |
| Abstrakt: |
Detailed researches the of space charge lens for focusing negative ion beam are performed for the cases when positive space charge forming is done either by the beam itself, or by special flow of electrons. Numerical simulations of space charge fields and beam ion trajectories are accomplished, and results of the calculations are compared with experimental data. It is shown both theoretically and experimentally that in the proposed device electric field strength reaches a value of ∼100 V/cm, thus providing a focal length of <20 cm. © 2004 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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