| Autor: |
Singh, Inderjeet, Rohit, Singh, B., Sandhu, B. S., Sabharwal, Arvind D. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2018, Vol. 2006 Issue 1, p1-4, 4p, 1 Color Photograph, 1 Graph |
| Abstrakt: |
The variation of signal-to-noise ratio (S/N ratio) with thickness of pure Z materials (6=Z=50) is calculated for backscattering of gamma photons, by employing an 3" x 3" NaI(Tl) scintillation detector. In order to have maximum back-scattered photons, detector is placed in back-scattering geometry without any collimation. Experimentally, it has been seen that numbers of multiply back-scattered photons increases with increase in target thickness and gets saturated at a particular depth called saturation depth. The detail of this study helps in Compton profile measurements as singly and multiply back-scattered gamma photons corresponds to signal and noise in it. It is concluded that signal-to-noise (S/N) ratio decreases with increase in thickness of the target as well as with increase in atomic number. Efficiency of 3" x 3" NaI(Tl) scintillation detector is corrected by making use of Response function on the recorded pulse-height distribution in order to have an increment in accuracy of experimental results. Monte Carlo calculations also support the present experimental results. Keywords: Saturation depth, Signal-to-noise Ratio, Response function. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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