Time resolved detection of particle contamination during thin film deposition.

Autor: Rüsseler, Anna Karoline, Balasa, Istvan, Kricheldorf, Hans-Ulrich, Vergöhl, Michael, Jensen, Lars, Ristau, Detlev
Zdroj: Proceedings of SPIE; 4/29/2018, p1-9, 9p
Databáze: Complementary Index