Neutron Reflectometry Studies of ZnO Films.
| Autor: | Zhaketov, V. D., Chitanu, E., Nikitenko, Yu. V. |
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| Zdroj: | Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Jul2018, Vol. 12 Issue 4, p658-664, 7p |
| Abstrakt: | Textured Al-doped ZnO films are studied using neutron reflectometry. The films are quasiperiodic structures with a period of several nanometers. The films are inhomogeneous in a surface layer with a thickness of 10-20 nm. [ABSTRACT FROM AUTHOR] |
| Databáze: | Complementary Index |
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