| Autor: |
Prokesch, Michael, Soldner, Stephen A., Sundaram, Arunmozhi G. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 2018, Vol. 124 Issue 4, pN.PAG-N.PAG, 8p, 2 Black and White Photographs, 15 Graphs |
| Abstrakt: |
Using the traveling heater method, we have developed commercial CdZnTe (CZT) crystal growth, fabrication, and in-house test technologies for both, photon-starved gamma spectroscopic sensors and high-flux x-ray photon-counting for medical imaging and other applications. We compare the performance of different CZT material types for gamma spectroscopy and for high-flux x-ray imaging. We demonstrate single-threshold photon counting and basic imaging capability of pixelated CZT detectors at the highest x-ray fluxes we could generate in-house, i.e., ∼250 × 106 photons/(mm2 s). We show that the test system can be used for universal, absolute flux calibration of x-ray beams based on an accurate pile-up fitting algorithm. The detectors also perform spectroscopically under high-flux, when tested with energy discriminating electronics. A brief investigation on the effects of leakage, photo, and excess currents including their temporal behavior is also presented. Sub 1% uncorrected single-pixel resolution of the 662 keV 137Cs full energy peak was achieved with the gamma spectroscopy optimized material, fabricated into pixelated sensors. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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