P‐44: Study on the Factor Affecting the Stress Reliability of GOA.

Autor: Du, Ruifang, Ma, Xiaoye, Ma, Rui, Gu, Xiaofang, Zhang, Donghui, Liu, Guodong, Lv, Fengzhen, Wang, Zhangtao, Shao, Xibin, Xue, Hailin
Předmět:
Zdroj: SID Symposium Digest of Technical Papers; May2018, Vol. 49 Issue 1, p1361-1364, 4p
Abstrakt: We fabricated different products with different GOA (Gate driver On Array) designs and did long‐term reliability experiments. Subsequently, we proposed some design suggestions to enhance the reliability of GOA, such as, noise reduction before and after one frame with total reset signal, reset the end unit with total reset signal, and the discharge of active area separated from GOA unit. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index