| Autor: |
Zafar, Sufi, Kaushik, Vidya, Laberge, Paul, Chu, Peir, Jones, Robert E., Hance, Robert L., Zurcher, Peter, White, Bruce E., Taylor, Deborah, Melnick, Bradley, Gillespie, Sherry |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 11/1/1997, Vol. 82 Issue 9, p4469, 6p, 9 Black and White Photographs, 1 Diagram, 1 Chart, 3 Graphs |
| Abstrakt: |
Investigates the effect of hydrogen on strontium bismuth tantalate ferroelectric capacitors. Use of x-ray diffraction, electron diffraction, Auger electron, scanning and transmission electron microscopies; Studying of changes in the ferroelectric films as a function of annealing gas and temperature; Identification of the mechanism for hydrogen induced damage to the capacitor. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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