The laser-only single-event effects test method for space electronics based on ultrashort-pulsed-laser "local irradiation".
| Autor: | Mavritskii, Oleg B., Egorov, Andrey N., Pechenkin, Alexander A., Chumakov, Alexander I., Savchenkov, Dmitriy V. |
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| Zdroj: | Proceedings of SPIE; 10/25/2017, Vol. 10522, p1-11, 11p |
| Databáze: | Complementary Index |
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