| Autor: |
Pacholski, Michaeleen L., Qu, Zhaohui, Ouyang, Wuye, Zheng, Zhibo, Wang, Rong |
| Předmět: |
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| Zdroj: |
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; May2018, Vol. 36 Issue 3, pN.PAG-N.PAG, 6p |
| Abstrakt: |
Depth profiles of thin, latex films using gas cluster ion beam (GCIB) secondary ion mass spectrometry (SIMS) show an oscillation of surfactants and polymer signal that is related to the organization of the particles in the film as layers. These results demonstrate the application of GCIB-SIMS to the distribution of water soluble species with molecular sensitivity, which has implications to film performance in areas of adhesion, appearance, and cohesion. Specifically, surfactant species were found at the highest concentrations at the air interface, decreasing through the top few particle layers to a steady state, whereas salt-rich species (sulfates, oligomers) were found at every particle boundary with a high concentration at the substrate interface. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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