| Autor: |
Wei-Jun Wan, Wei Ren, Xiao-Ran Meng, Yun-Xia Ping, Xing Wei, Zhong-Ying Xue, Wen-Jie Yu, Miao Zhang, Zeng-Feng Di, Bo Zhang |
| Předmět: |
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| Zdroj: |
Chinese Physics Letters; May2018, Vol. 35 Issue 5, p1-1, 1p |
| Abstrakt: |
We report an effective method to improve the formation of nickel stanogermanide (NiGeSn) by the incorporation of a platinum (Pt) interlayer. After the Ni/Pt/GeSn samples are annealed we obtain uniform NiGeSn thin films, which are characterized by means of sheet resistance, atomic force microscopy, scanning electron microscopy, cross-section transmission electron microscopy, and energy dispersive x-ray spectroscopy. These results show that the presence of Pt increases the smoothness and uniform morphology of NiGeSn films. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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