Co-optimization of Exposure Dose and Etch process for SAQP Pitch walk control.

Autor: Maslow, Mark John, Timoshkov, Vadim, Kiers, Ton, Tae Kwon Jee, Reijnen, Liesbeth, Kumar, Kaushik, Demand, Marc, Fonseca, Carlos, Cerbu, Florin, Schelcher, Guillaume, Beral, Christophe
Zdroj: Proceedings of SPIE; 1/15/2018, Vol. 10587, p1-14, 14p
Databáze: Complementary Index