Defect-generation and diffusion in (In)AlGaN-based UV-B LEDs submitted to constant current stress.

Autor: Monti, D., Meneghini, M., De Santi, C., Da Ruos, S., Meneghesso, G., Zanoni, E., Glaab, J., Rass, J., Einfeldt, S., Mehnke, F., Enslin, J., Wernicke, T., Kneissl, M.
Zdroj: Proceedings of SPIE; 11/16/2017, Vol. 10554, p1-8, 8p
Databáze: Complementary Index