Defect-generation and diffusion in (In)AlGaN-based UV-B LEDs submitted to constant current stress.
Autor: | Monti, D., Meneghini, M., De Santi, C., Da Ruos, S., Meneghesso, G., Zanoni, E., Glaab, J., Rass, J., Einfeldt, S., Mehnke, F., Enslin, J., Wernicke, T., Kneissl, M. |
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Zdroj: | Proceedings of SPIE; 11/16/2017, Vol. 10554, p1-8, 8p |
Databáze: | Complementary Index |
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