EUV contact-hole local CD uniformity optimization for DRAM Storage Node application.

Autor: Mijung Lim, Chang-Moon Lim, Chang-Nam Ahn, Nak Seong, Park, Daniel, Fumar-Pici, Anita
Zdroj: Proceedings of SPIE; 1/11/2018, Vol. 10583, p1-8, 8p
Databáze: Complementary Index