| Autor: |
Gubari, Ghamdan M. M., M., Ibrahim Mohammed S., Huse, Nanasaheb P., Dive, Avinash S., Sharma, Ramphal, Shekhawat, Manoj Singh, Bhardwaj, Sudhir, Suthar, Bhuvneshwer |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2018, Vol. 1953 Issue 1, pN.PAG-N.PAG, 4p |
| Abstrakt: |
We have successfully deposited CuZnO thin film on a glass substrate by facile chemical bath deposition method at 85 °C for 1 hr. Structural, topographical, Optical and Electrical properties of the prepared Thin Films were investigated by XRD, Raman spectrum, AFM, UV-Visible Spectrophotometer and I-V Measurement System respectively. The X-ray diffraction (XRD) pattern confirmed the formation of the CuZnO composition when compared with standard JCPDS card (JCPDF # 75-0576 & # 36-1451). The Raman analysis shows a major peak at 458 cm-1 with E2 (High) vibrational mode. AFM images revealed uniform deposition over an entire glass substrate with 66.2 nm average roughness of the film. From the optical absorption spectrum, clear band edge around ∼407 nm was observed which results in a wide energy band gap of ∼3.04 eV. The electrical properties were measured at room temperature in the voltage range ±5 V, showed a drastic enhancement in current under light illumination with the highest photosensitivity of ∼99.9 % for 260 W. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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