| Autor: |
Shafura, A. K., Saurdi, I., Sin, N. D. Md, Noor, Uzer Mohd, Mamat, M. H., Alrokayan, Salman A. H., Khan, Haseeb A., Rusop, M., Mahmood, Mohamad Rusop, Soga, Tetsuo, Nagaoka, Shiro, Mamat, Mohamad Hafiz, Jafar, Salifairus Mohammad |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2018, Vol. 1963 Issue 1, pN.PAG-N.PAG, 5p, 2 Color Photographs, 1 Black and White Photograph, 1 Chart, 1 Graph |
| Abstrakt: |
Nanostructured zinc oxide (ZnO) thin film was deposited using immersion method. The molarity was varied in range of 0.02 to 0.10 M in this study. The surface morphology was observed by field emission scanning microscopy (FESEM). Meanwhile, the roughness were characterised by atomic force microscopy (AFM). The current-voltage (I-V) measurement was done to determine its electrical properties. Flake-like morphology was found to increase the electrical properties of nanostructured ZnO thin film. The uniformity was increased when the molarity was increased. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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