DIRECT OBSERVATION OF THE TUNABLE OCCUPANCY OF SHALLOW- AND DEEP-DX-RELATED LEVELS AND THE EXISTENCE OF A PARASITIC SHALLOW LEVEL IN n-AlxGa1-xAs LAYERS AS A FUNCTION OF HYDROSTATIC PRESSURE.
Autor: | Lavielle, D., Goutiers, B., Kadri, A., Ranz, E., Omowski, L., Portal, J. C., Grattepain, C., Chand, N., Sallese, J. M., Gibart, P. |
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Zdroj: | Physics of Semiconductors - Proceedings of the 20th International Conference (In 3 Volumes); 1990, p521-524, 4p |
Databáze: | Complementary Index |
Externí odkaz: |