Defect-related degradation of III-V/Silicon 1.55 μm DBR laser diodes.
| Autor: | Buffolo, Matteo, Meneghini, Matteo, De Santi, Carlo, Trivellin, Nicola, Davenport, Michael L., Bowers, John E., Meneghesso, Gaudenzio, Zanoni, Enrico |
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| Zdroj: | Proceedings of SPIE; 11/9/2017, Vol. 10537, p105370X-1-105370X-6, 6p, 1 Diagram, 6 Graphs |
| Databáze: | Complementary Index |
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