Spectroscopic-ellipsometrical characterization of photon-surface-plasmon coupling in a multilayer diffraction grating.

Autor:	YASTRUBCHAK, O., DEMCHUK, O.
Předmět:	DIFFRACTION gratings BRAGG gratings THIN films WAVELENGTHS OPTICAL gratings
Zdroj:	Epioptics 2000, Procs of the 19th Course of the Intl School of Solid State Physics; 2001, p128-133, 6p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu