RADIATION EFFECTS MICROSCOPY AND CHARGE TRANSPORT SIMULATIONS.

Autor:	HORN, K. M., WALSH, D. S., DODD, P. E., DOYLE, B. L.
Předmět:	RADIATION damage MICROSCOPY COMPUTER simulation ELECTRONIC equipment EXCITON theory
Zdroj:	Fundamental & Applied Aspects of Modern Physics, Proceedings of the Intl Conf on Fundamental & Applied Aspects of Modern Physics; 2001, p188-200, 13p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu