SHALLOW ELECTRONIC TRAPS ASSOCIATED WITH HYDROGEN COMPLEXES IN CRYSTALLINE SILICON.

Autor: SAFONOV, A. N., LIGHTOWLERS, E. C., DAVIES, G.
Předmět:
Zdroj: Shallow-Level Centers in Semiconductors - Proceedings of the 7th International Conference; 1997, p43-54, 12p
Databáze: Complementary Index