SHALLOW ELECTRONIC TRAPS ASSOCIATED WITH HYDROGEN COMPLEXES IN CRYSTALLINE SILICON.
Autor: | SAFONOV, A. N., LIGHTOWLERS, E. C., DAVIES, G. |
---|---|
Předmět: | |
Zdroj: | Shallow-Level Centers in Semiconductors - Proceedings of the 7th International Conference; 1997, p43-54, 12p |
Databáze: | Complementary Index |
Externí odkaz: |