| Autor: |
Dzhemilev, N. Kh., Kovalenko, S. F., Maksimov, S. E., Tukfatullin, O. F., Khojiev, Sh. T. |
| Zdroj: |
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Jan2018, Vol. 12 Issue 1, p50-53, 4p |
| Abstrakt: |
The decay of VnOm+ and NbnOm+ clusters sputtered under bombardment of the surfaces of vanadium and niobium with Xe+ ions and oxygen inflow is investigated by secondary-ion mass spectrometry. Based on experimental data, the excitation energy is calculated within the framework of the theory of unimolecular reactions. It is demonstrated that the numerical values of the specific excitation energy of VnOm+ and NbnOm+ within the accuracy of the procedure do not depend significantly on the number of atoms that make up the clusters, nor on their type. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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