Electrical properties of thin films deposited from TMS/O2 in Microwave Multipolar Plasma reactor.
Autor: | M Kihel, S Sahli, Y Fermi, P Raynaud, M Benhaddad |
---|---|
Zdroj: | Journal of Physics: Conference Series; 2018, Vol. 987 Issue 1, p1-1, 1p |
Databáze: | Complementary Index |
Externí odkaz: |