| Autor: |
Samia, A. C. S., Lou, Y., Burda, C., Senter, R. A., Coffer, J. L. |
| Předmět: |
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| Zdroj: |
Journal of Chemical Physics; 5/8/2004, Vol. 120 Issue 18, p8716-8723, 8p, 3 Diagrams, 1 Chart, 6 Graphs |
| Abstrakt: |
Femtosecond pump–probe absorption spectroscopy is used to investigate the role of Er3+ dopants in the early relaxation pathways of photoexcited Si nanocrystals. The fate of photoexcited electrons in three different Si nanostructures was studied and correlated with the effect of Er-doping and the nature of the dopant architecture. In Si nanocrystals without Er3+ dopant, a trapping component was identified to be a major electron relaxation mechanism. Addition of Er3+ ions into the core or surface shell of the nanocrystals was found to open up additional nonradiative relaxation pathways, which is attributed to Er-induced trap states in the Si host. Analysis of the photodynamics of the Si nanocrystal samples reveals an electron trapping mechanism involving trap-to-trap hopping in the doped nanocrystals, whereby the density of deep traps seem to increase with the presence of erbium. To gain additional insights on the relative depths of the trapping sites on the investigated nanostructures, benzoquinone was used as a surface adsorbed electron acceptor to facilitate photoinduced electron transfer across the nanocrystal surface and subsequently assist in back electron transfer. The established reduction potential (-0.45 V versus SCE) of the electron acceptor helped reveal that the erbium-doped nanocrystal samples have deeper trapping sites than the undoped Si. Furthermore, the measurements indicate that internally Er-doped Si have relatively deeper trapping sites than the erbium surface-enriched nanocrystals. The electron-shuttling experiment also reveals that the back electron transfer seems not to recover completely to the ground state in the doped Si nanocrystals, which is explained by a mechanism whereby the electrons are captured by deep trapping sites induced by erbium addition in the Si lattice. © 2004 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
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