Autor: |
Schwartz, Gustavo Ariel, Navarro, Jaume |
Zdroj: |
Philosophy of Photography; Apr2018, Vol. 9 Issue 1, p41-52, 12p, 1 Color Photograph, 1 Diagram, 1 Graph |
Abstrakt: |
The article offers information on atomic force microscopy (AFM). Topics discussed include construction process of images in nanoscale; innovative and specific type of type of observation of the nanoscale; simple measuring techniques accompanied by two developments that is better understanding of the laws of optics and the study of the human eye as an optical instrument. |
Databáze: |
Complementary Index |
Externí odkaz: |
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