Imaging by touching: Atomic force microscopy.

Autor: Schwartz, Gustavo Ariel, Navarro, Jaume
Zdroj: Philosophy of Photography; Apr2018, Vol. 9 Issue 1, p41-52, 12p, 1 Color Photograph, 1 Diagram, 1 Graph
Abstrakt: The article offers information on atomic force microscopy (AFM). Topics discussed include construction process of images in nanoscale; innovative and specific type of type of observation of the nanoscale; simple measuring techniques accompanied by two developments that is better understanding of the laws of optics and the study of the human eye as an optical instrument.
Databáze: Complementary Index