THIN FILM OPTICAL METROLOGY USING PRINCIPLES OF WAVEFRONT SENSING AND INTERFERENCE.

Autor:	FAICHNIE, DAVID M., GREENA WAY, ALAN H., BAIN, IAN
Předmět:	METROLOGY OPTICAL interference THIN films ADAPTIVE optics WAVEFRONT sensors
Zdroj:	Adaptive Optics For Industry & Medicine - Proceedings of the Sixth International Workshop; 2008, p237-242, 6p, 3 Black and White Photographs, 1 Graph
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu