Autor: |
Hu, Yiwei, Hao, Qiaoyan, Zhu, Baichuan, Li, Biao, Gao, Zhan, Wang, Yan, Tang, Kaibin |
Předmět: |
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Zdroj: |
Nanoscale Research Letters; 1/15/2018, Vol. 13 Issue 1, p1-N.PAG, 7p |
Abstrakt: |
Tantalum disulfide nanosheets have attracted great interest due to its electronic properties and device applications. Traditional solution-ased ultrasonic process is limited by ultrasound which may cause the disintegration into submicron-sized flake. Here, an efficient multi-step intercalation and ultrasound-free process has been successfully used to exfoliate 1T-TaS. The obtained TaS nanosheets reveal an average thickness of 3 nm and several micrometers in size. The formation of few-layer TaS nanosheets as well as monolayer TaS sheets is further confirmed by atomic force microscopy images. The few-layer TaS nanosheets remain the 1T structure, whereas monolayer TaS sheets show lattice distortion and may adopt the 1H-like structure with trigonal prism coordination. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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