GaN 基 HEMTs 器件热测试技术与应用进展.

Autor: 李汝冠, 廖雪阳, 尧彬, 周斌, 陈义强
Zdroj: Electronic Components & Materials; sep2017, Vol. 36 Issue 9, p1-9, 9p
Databáze: Complementary Index