New Workflows Broaden Access to S/TEM Analysis and Increase Productivity.
| Autor: | Van Leer, Brandon, Geurts, Remco, Scharfschwerdt, Raphaela, Cheng, Huikai, Li, Letian, Imlau, Robert |
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| Zdroj: | Microscopy Today; Jan2018, Vol. 26 Issue 1, p18-25, 8p |
| Databáze: | Complementary Index |
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