| Autor: |
Lascaud, J., Defforge, T., Certon, D., Valente, D., Gautier, G. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 12/7/2017, Vol. 122 Issue 21, p1-7, 7p |
| Abstrakt: |
The formation of thick mesoporous silicon layers in Pþ-type substrates leads to an increase in the porosity from the surface to the interface with silicon. The adjustment of the current density during the electrochemical etching of porous silicon is an intuitive way to control the layer in-depth porosity. The duration and the current density during the anodization were varied to empirically model porosity variations with layer thickness and build a database. Current density profiles were extracted from the model in order to etch layer with in-depth control porosity. As a proof of principle, an 80 μm-thick porous silicon multilayer was synthetized with decreasing porosities from 55% to 35%. The results show that the assessment of the in-depth porosity could be significantly enhanced by taking into account the pure chemical etching of the layer in the hydrofluoric acid-based electrolyte. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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