TESTING THE FRICTIONAL PROPERTIES OF 3 THIN FILM SURFACE WITH AFM: A NANOSCOPIC LEVEL INVESTIGATION.

Autor: KLEIN, H., PAILHAREY, D., MATHEY, Y., TORREGROSSA, F.
Zdroj: Surface Review & Letters; Oct1997, Vol. 4 Issue 5, p1031-1034, 4p
Abstrakt: In this study we have realized 3 thin film synthesis, mainly under the (110) orientation, and performed their frictional study using an AFM to obtain values of friction coefficients μ. This technique appears to be a good way for the investigation of the frictional properties at the microscopic scale. Indeed we can mark the difference between two crystalline states of 3 by their frictional properties. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index