| Autor: |
Neha Thakur, Pulikanti Guruprasad Reddy, Santu Nandi, Midathala Yogesh, Satinder K Sharma, Chullikkattil P Pradeep, Subrata Ghosh, Kenneth E Gonsalves |
| Předmět: |
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| Zdroj: |
Journal of Micromechanics & Microengineering; Dec2017, Vol. 27 Issue 12, p1-1, 1p |
| Abstrakt: |
The development of new photoresist materials for multi-lithography applications is crucial but a challenging task for semiconductor industries. During the last few decades, given the need for new resists to meet the requirements of semiconductor industries, several research groups have developed different resist materials for specific lithography applications. In this context, we have successfully synthesized a new molecular non-chemically amplified resist (n-CAR) (C3) based on the functionalization of aromatic hydroxyl core (4,4′-(9H-fluorene-9,9-diyl)diphenol) with radiation sensitive sulfonium triflates for various lithography applications. While, micron scale features have been developed using i-line (365 nm) and DUVL (254 nm) exposure tools, electron beam studies on C3 thin films enabled us to pattern 20 nm line features with L/3S (line/space) characteristics on the silicon substrate. The sensitivity and contrast were calculated from the contrast curve analysis as 280 µC cm−2 and 0.025 respectively. Being an important parameter for any newly developed resists, the line edge roughness (LER) of 30 nm (L/5S) features were calculated, using SUMMIT metrology package, to be 3.66 ± 0.3 nm and found to be within the acceptable range. AFM analysis further confirmed 20 nm line width with smooth pattern wall. No deformation of patterned features was observed during AFM analysis which indicated good adhesion property between patterned resists and silicon substrates. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
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