Narrow-Beam Argon Ion Milling of Carbon-Supported Ex Situ Lift-Out FIB Specimens.
| Autor: | Campin, M. J., Bonifacio, C. S., Kang, H. H., Nowakowski, P., Boccabella, M., Fischione, P. E. |
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| Zdroj: | Microscopy & Microanalysis; 2017 Special issue, Vol. 23, p302-303, 2p, 1 Black and White Photograph, 1 Graph |
| Databáze: | Complementary Index |
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