The Future of Direct Electron Detection in Cryo-TEM.
Autor: | van Duinen, Gijs, Lingbo Yu, Franken, Erik, Kuijper, Maarten, Roeven, Hans, Janssen, Bart |
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Zdroj: | Microscopy & Microanalysis; 2017 Special issue, Vol. 23, p838-839, 2p, 1 Diagram |
Databáze: | Complementary Index |
Externí odkaz: |