The Future of Direct Electron Detection in Cryo-TEM.

Autor: van Duinen, Gijs, Lingbo Yu, Franken, Erik, Kuijper, Maarten, Roeven, Hans, Janssen, Bart
Zdroj: Microscopy & Microanalysis; 2017 Special issue, Vol. 23, p838-839, 2p, 1 Diagram
Databáze: Complementary Index