Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation.
| Autor: | Nowakowski, P., Bonifacio, C. S., Campin, M. J., Ray, M. L., Fischione, P. E. |
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| Zdroj: | Microscopy & Microanalysis; 2017 Special issue, Vol. 23, p300-301, 2p, 1 Black and White Photograph, 1 Chart, 1 Graph |
| Databáze: | Complementary Index |
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