| Autor: |
Aliaj, Fisnik Rr., Syla, Naim, Oettel, Heinrich, Dilo, Teuta |
| Předmět: |
|
| Zdroj: |
Surface & Interface Analysis: SIA; Nov2017, Vol. 49 Issue 11, p1135-1141, 7p |
| Abstrakt: |
This paper presents a nondestructive X-ray diffraction method for the accurate determination of thicknesses of polycrystalline TiN and amorphous-like TiAl coatings deposited by DC magnetron sputtering onto thick polycrystalline stainless steel and carbon steel substrates. This method relies on the measurement of intensity loss of a substrate reflection caused by the deposition of the coating. The uncertainty of the thickness measurements by the X-ray diffraction depends on the mass absorption coefficient of the coating material and the quality of the collected diffraction patterns. For the coatings considered, thicknesses determined by the X-ray diffraction method show very good agreement with the thickness values measured by scanning electron microscopy and ball crater techniques. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
Plný text