| Autor: |
Tang, L. W., Ong, N. R., Mohamad, I. S. B., Alcain, J. B., Retnasamy, V. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2017, Vol. 1885 Issue 1, p1-8, 8p, 1 Color Photograph, 2 Diagrams, 3 Charts, 2 Graphs |
| Abstrakt: |
Probe pins are useful for electrical testing of microelectronic components, printed circuit board assembly (PCBA), microprocessors and other electronic devices due to it provides the conductivity test based on specific device circuit design. During the repeatable test runs, the load of test modules, contact failures and the current conductivity induces layer wear off all the tip of probe pins contact. Contamination will be build-up on probe pins and increased contact resistivity which results of cost loss and time loss for rectifying programs, rectifying testers and exchanging new probe pins. In this study, a resistivity approach will be developed to provide Testing of Test Probes. The test module based on Four-wire Ohm measurement method with two alternative ways of applying power supply, that are 9V from a single power supply and 5V from Arduino UNO power supply were demonstrated to measure the small resistance value of microprocessor probe pin. A microcontroller with VEE Pro software was used to record the measurement data. The accuracy of both test modules were calibrated under different temperature conditions and result shows that 9V from a single power supply test module has higher measurement accuracy. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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