Inexpensive Home-Made Single Wavelength Ellipsometer (λ = 633 nm) for Measuring the Optical Constant of Nanostructured Materials.
| Autor: | L Z Maulana, K Megasari, E Suharyadi, R Anugraha, K Abraha, I Santoso |
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| Zdroj: | IOP Conference Series: Materials Science & Engineering; Jun2017, Vol. 202 Issue 1, p1-1, 1p |
| Databáze: | Complementary Index |
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