Atom Probe Tomography & Microscopy APT&M 2016 From Science to Industry Organized under the auspices of the International Field Emission Society June 12th–17th, 2016, Gyeongju, Korea.
| Autor: | Thuvander, Mattias, Cairney, Julie, Gerstl, Stephan |
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| Zdroj: | Microscopy & Microanalysis; Apr2017, Vol. 23 Issue 2, p187-193, 7p |
| Databáze: | Complementary Index |
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