| Autor: |
Wistrela, E., Bittner, A., Schneider, M., Reissner, M., Schmid, U. |
| Předmět: |
|
| Zdroj: |
Journal of Applied Physics; 2017, Vol. 121 Issue 11, p1-7, 7p, 1 Diagram, 1 Chart, 6 Graphs |
| Abstrakt: |
In this paper, we report on the microstructural and magnetic properties of CrxAl1-xN thin films with Cr concentrations ranging up to x=(8.5 ± 0.5) at. %. The thin films are sputter deposited on silicon substrates and exhibit a wurtzite type microstructure verified by X-ray diffraction measurements. A vibrating sample magnetometer based measurement equipment is used to investigate magnetic properties of the Cr doped thin films in a temperature range of T=10 K-300 K, revealing a paramagnetic behavior. With increasing temperature, the temperature independent diamagnetic contribution of the substrate material dominates the overall response characteristics. No room temperature ferromagnetism is observed for all samples investigated. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
