Flat-Panel X-Ray Detector Using Amorphous Silicon Technology.
Autor: | VÖlk, Markus, Strotzer, Michael, Gmeinwieser, Josef, Alexander†, Joachim, FrÜnd, RÜdiger, Seitz, Johannes, Manke, Christoph, Spahn, Martin, Feuerbach, Stefan, Runge, Val M., Allison, David J., Bradley Jr., William G., Claussen, Claus D., Dietrich, Rosalind B., Dondelinger, Robert F., Eckelman, William C., Felix, Roland, Finn, Paul, Gore, John C., Gourtsoyiannis, Nicholas C. |
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Zdroj: | Investigative Radiology; Jul1997, Vol. 32 Issue 7, p373-377, 5p |
Databáze: | Complementary Index |
Externí odkaz: |