Application and comparison of analytic accelerated test-models for lifetime prediction of a novel contacting method.
| Autor: | Spahr, M., Kreitlein, S., Haas, R., Jaumann, A., Glasel, T., Spreng, S., Franke, J. |
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| Zdroj: | 2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm); 2016, p94-99, 6p |
| Databáze: | Complementary Index |
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