A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction.
| Autor: | Amyeen, M. Enamul, Pomeranz, Irith, Venkataraman, Srikanth |
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| Zdroj: | 2016 IEEE 25th Asian Test Symposium (ATS); 2016, p138-143, 6p |
| Databáze: | Complementary Index |
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