Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths During At-Speed Scan Test.
| Autor: | Holst, Stefan, Schneider, Eric, Wen, Xiaoqing, Kajihara, Seiji, Yamato, Yuta, Wunderlich, Hans-Joachim, Kochte, Michael A. |
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| Zdroj: | 2016 IEEE 25th Asian Test Symposium (ATS); 2016, p19-24, 6p |
| Databáze: | Complementary Index |
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